先进材料表征技术（分析）
Advanced Materials Characterization Techniques (Analytical)
- 1 - Introduction
- 2 - Introduction and Development of Electron Microscopy
- 3 - Kanaya Okayama Formula and Electron Matter interactions
- 4 - SEM Instrumentation and Working Principle
- 5 - SEM Instrumentation
- 6 - Transmission Electron Microscopy TEM Instrumentation and Working Principle
- 7 - Comparison of SEM and TEM
- 8 - Atomic force microscopy AFMAtomic Forces
- 9 - Principle of AFM
- 10 - working of AFM
- 11 - Modes of AFM and comparison with other microscopies
- 12 - Limitations and Applications of AFM
- 13 - XPS Photoelectric effect and Xrays
- 14 - Binding energy kinetic energy and work function
- 15 - XPSInstrumentation
- 16 - Phenomenon associated with XPS
- 17 - Chemical Shifts and Spin Orbit Coupling
- 18 - Final Shake Up and Shake off Effects
- 19 - Angle Resolved XPS
- 20 - Raman Spectroscopy Raman Effects Stokes and antiStokes Shift
- 21 - Comparison of Raman with IR
- 22 - Raman Instrumentation
- 23 - Electron Energy Loss Spectroscopy
- 24 - Surface Plasmons and High energy Loss region
- 25 - White lines Fine Edge Structure in XPS Applications and Comparison with EDX
- 26 - EELS Spectral Analysis
- 27 - EDX Mechanism and Production of Xray
- 28 - EDX Instrumentation
- 29 - EDX Instrumentations II and Applications of EDX
- 30 - XRD principle and Braggs Equation
- 31 - XRD Instrumentation and Transmission Laue Method
- 32 - Rotating Crystal method and Powder method of XRD
- 33 - Spectral analysis of XRD and Small and Wide anlge Scattering SAXS WAXS
- 34 - Working Principle of TGA
- 35 - Instrumentaton of TGA with NULL and DEFLECTION Balanaces
- 36 - TGA instrumentation and factors affecting TGA Curve
- 37 - How to perform sample analysis on TGA
- 38 - DTA principle and Instrumentation
- 39 - DTA applications factors affecting the analysis
- 40 - Principle of DSC DSC Types and Power Compensaton method
- 41 - Heat Flux Method and DSC Curves
- 42 - Factors affecting DSC and Applications of DSC